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<p class="MsoBodyText"><span lang="EN-GB">This document specifies procedures for the rating and statistical analysis of non-metallic inclusions (referred to as inclusions hereafter) using a scanning electron microscope (SEM) with an energy dispersive X-ray spectrometer (EDS), a backscattered detector (BSD) and automatic image analysis capabilities.</span></p>
Reģistrācijas numurs (WIID)
81308
Darbības sfēra
<p class="MsoBodyText"><span lang="EN-GB">This document specifies procedures for the rating and statistical analysis of non-metallic inclusions (referred to as inclusions hereafter) using a scanning electron microscope (SEM) with an energy dispersive X-ray spectrometer (EDS), a backscattered detector (BSD) and automatic image analysis capabilities.</span></p>
