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<p class="MsoBodyText"><span lang="EN-GB">This document specifies requirements and provides guidance for the use of charge conditioners for aerosol particles, especially for particle characterization and for the generation of calibration and test aerosols.</span></p>
<p class="MsoBodyText"><span lang="EN-GB">This document provides a methodology to specify the performance of charge conditioners and for adequate quality control, with respect to their application in:</span></p>
<p class="MsoBodyText"><span lang="EN-GB">— particle size and concentration measurement with differential mobility analysing systems (DMAS);</span></p>
<p class="MsoBodyText"><span lang="EN-GB">—particle size classification with differential electrical mobility classifiers (DEMC). </span></p>
<p class="MsoBodyText"><span lang="EN-GB">For these applications, this document covers particle charge conditioning for particle sizes ranging from approximately 1 nm to 1 µm and for particle number concentrations at the inlet of the charge conditioner up to approximately 10<sup>7</sup> cm<sup>-3</sup>.</span></p>
<p class="MsoBodyText"><span lang="EN-GB">This document does not address specific charge conditioner designs or other applications besides those specified in Clause 1.</span></p>
<p class="MsoBodyText"><span lang="EN-GB">Radiation safety for charge conditioners with radioactive sources or x-ray tubes is not covered by this document.</span></p>
Reģistrācijas numurs (WIID)
73974
Darbības sfēra
<p class="MsoBodyText"><span lang="EN-GB">This document specifies requirements and provides guidance for the use of charge conditioners for aerosol particles, especially for particle characterization and for the generation of calibration and test aerosols.</span></p>
<p class="MsoBodyText"><span lang="EN-GB">This document provides a methodology to specify the performance of charge conditioners and for adequate quality control, with respect to their application in:</span></p>
<p class="MsoBodyText"><span lang="EN-GB">— particle size and concentration measurement with differential mobility analysing systems (DMAS);</span></p>
<p class="MsoBodyText"><span lang="EN-GB">—particle size classification with differential electrical mobility classifiers (DEMC). </span></p>
<p class="MsoBodyText"><span lang="EN-GB">For these applications, this document covers particle charge conditioning for particle sizes ranging from approximately 1 nm to 1 µm and for particle number concentrations at the inlet of the charge conditioner up to approximately 10<sup>7</sup> cm<sup>-3</sup>.</span></p>
<p class="MsoBodyText"><span lang="EN-GB">This document does not address specific charge conditioner designs or other applications besides those specified in Clause 1.</span></p>
<p class="MsoBodyText"><span lang="EN-GB">Radiation safety for charge conditioners with radioactive sources or x-ray tubes is not covered by this document.</span></p>
