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This Technical Report gives guidance on a prioritized selection of measurement parameters and instrumental techniques to be used for the characterization of nanoparticles. For each technique described, relevant performance parameters of the method are summarized. Use of certified reference materials, where available, is addressed. Where possible, guidance is given on levels of uncertainty, resolution, accuracy and reproducibility associated with measurement of the specified particle parameters under different conditions.
Reģistrācijas numurs (WIID)
31769
Darbības sfēra
This Technical Report gives guidance on a prioritized selection of measurement parameters and instrumental techniques to be used for the characterization of nanoparticles. For each technique described, relevant performance parameters of the method are summarized. Use of certified reference materials, where available, is addressed. Where possible, guidance is given on levels of uncertainty, resolution, accuracy and reproducibility associated with measurement of the specified particle parameters under different conditions.
