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This document specifies a number of general aspects of X-Ray diffractometry in plastic characterization, such as the principle and the apparatus, sampling, calibration and general aspects of the procedure and test report common to all following parts. This document is applicable to plastics characterization methods using small angle X-ray scattering, wide angel X-ray scattering, 2D and 3D X-ray pattern analysis, etc. This document is not applicable to plastics characterization methods using X-ray source from synchrotron radiation. Details on performing specific methods are given in subsequent parts of this series of ISO standards.
Reģistrācijas numurs (WIID)
83304
Darbības sfēra
This document specifies a number of general aspects of X-Ray diffractometry in plastic characterization, such as the principle and the apparatus, sampling, calibration and general aspects of the procedure and test report common to all following parts. This document is applicable to plastics characterization methods using small angle X-ray scattering, wide angel X-ray scattering, 2D and 3D X-ray pattern analysis, etc. This document is not applicable to plastics characterization methods using X-ray source from synchrotron radiation. Details on performing specific methods are given in subsequent parts of this series of ISO standards.
