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<p>ISO 2931:2017 specifies a method for assessing the quality of sealed anodic oxidation coatings on aluminium and its alloys by measurement of the admittance.</p>
<p>The method is applicable to anodic oxidation coatings sealed in an aqueous medium.</p>
<p>NOTE 1 Results obtained from anodic oxidation coatings sealed by different methods, e.g. hydrothermal sealing and cold sealing, are not necessarily comparable.</p>
<p>NOTE 2 Results obtained from anodic oxidation coatings on alloys containing more than 2 % silicon or 5 % manganese or 3 % magnesium are not comparable with results obtained from anodic oxidation coatings on more dilute alloys.</p>
<p>The method is suitable for use as a production-control test and as an acceptance test where there is agreement between the anodizer and the customer.</p>
<p>Any type of anodized component can be tested by the method described, provided that there is a sufficient area (a circle of diameter about 20 mm) and that the film thickness is greater than 3 µm.</p>
Reģistrācijas numurs (WIID)
70155
Darbības sfēra
<p>ISO 2931:2017 specifies a method for assessing the quality of sealed anodic oxidation coatings on aluminium and its alloys by measurement of the admittance.</p>
<p>The method is applicable to anodic oxidation coatings sealed in an aqueous medium.</p>
<p>NOTE 1 Results obtained from anodic oxidation coatings sealed by different methods, e.g. hydrothermal sealing and cold sealing, are not necessarily comparable.</p>
<p>NOTE 2 Results obtained from anodic oxidation coatings on alloys containing more than 2 % silicon or 5 % manganese or 3 % magnesium are not comparable with results obtained from anodic oxidation coatings on more dilute alloys.</p>
<p>The method is suitable for use as a production-control test and as an acceptance test where there is agreement between the anodizer and the customer.</p>
<p>Any type of anodized component can be tested by the method described, provided that there is a sufficient area (a circle of diameter about 20 mm) and that the film thickness is greater than 3 µm.</p>