ISO/TC 107
| Projekta Nr. | ISO 3868:1976 |
|---|---|
| Nosaukums | <p>Specifies a method for the measurement of the thickness of thin, highly reflective coatings (up to 2 ) by the use of Fizeau muliple-beam interferometry. The method described cannot be applied to vitreous enamel coatings. Gives principle, definitions, equipment, factors affecting in the measuring accuracy, calibration, procedure and measuring precision.</p> |
| Reģistrācijas numurs (WIID) | 9460 |
| Darbības sfēra | <p>Specifies a method for the measurement of the thickness of thin, highly reflective coatings (up to 2 ) by the use of Fizeau muliple-beam interferometry. The method described cannot be applied to vitreous enamel coatings. Gives principle, definitions, equipment, factors affecting in the measuring accuracy, calibration, procedure and measuring precision.</p> |
| Statuss | Standarts spēkā |
| ICS grupa | 25.220.20 25.220.40 |