ISO/TC 201/SC 3
| Projekta Nr. | ISO 14975:2000 |
|---|---|
| Nosaukums | <p>This International Standard specifies a format to supplement ISO 14976 to transfer data for the creation, expansion</p> <p>and revision of a surface chemical analysis spectral database. The format is applied to Auger electron</p> <p>spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) spectral data.</p> |
| Reģistrācijas numurs (WIID) | 24270 |
| Darbības sfēra | <p>This International Standard specifies a format to supplement ISO 14976 to transfer data for the creation, expansion</p> <p>and revision of a surface chemical analysis spectral database. The format is applied to Auger electron</p> <p>spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) spectral data.</p> |
| Statuss | Standarts spēkā |
| ICS grupa | 35.240.70 71.040.40 |
