Informējam, ka Sistēma pielāgota darbam ar interneta pārlūkprogrammu Internet Explorer (8. un jaunākām versijām) un Mozilla Firefox (3.6 un jaunākām versijām).
Izmantojot citu interneta pārlūkprogrammu, brīdinām, ka Sistēmas funkcionalitāte var tikt traucēta.
<p>ISO 19606:2017 describes a method to evaluate the adequateness of a probe tip for fine-ceramic thin-film surface roughness measurements by atomic force microscopy, of surfaces with an arithmetical mean roughness, <i>Ra</i>, in the range of about 1 nm to 30 nm and a mean width of roughness profile elements, <i>RSm</i>, in the range of about 0,04 μm to 2,5 μm.</p>
Reģistrācijas numurs (WIID)
65457
Darbības sfēra
<p>ISO 19606:2017 describes a method to evaluate the adequateness of a probe tip for fine-ceramic thin-film surface roughness measurements by atomic force microscopy, of surfaces with an arithmetical mean roughness, <i>Ra</i>, in the range of about 1 nm to 30 nm and a mean width of roughness profile elements, <i>RSm</i>, in the range of about 0,04 μm to 2,5 μm.</p>
