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<p>ISO 23201:2015 sets out a wavelength dispersive X-ray fluorescence spectrometric method for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium, titanium, phosphorus, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel. These elements are expressed as the oxides Na<sub>2</sub>O, SiO<sub>2</sub>, Fe2O<sub>3</sub>, CaO, TiO<sub>2</sub>, P<sub>2</sub>O<sub>5</sub>, V<sub>2</sub>O<sub>5</sub>, ZnO, MnO, Ga<sub>2</sub>O<sub>3</sub>, K2O, CuO, Cr<sub>2</sub>O<sub>3</sub>, and NiO on an un-dried sample basis. The method is applicable to smelting-grade aluminium oxide. The concentration range covered for each of the components is also given.</p>
Reģistrācijas numurs (WIID)
50501
Darbības sfēra
<p>ISO 23201:2015 sets out a wavelength dispersive X-ray fluorescence spectrometric method for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium, titanium, phosphorus, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel. These elements are expressed as the oxides Na<sub>2</sub>O, SiO<sub>2</sub>, Fe2O<sub>3</sub>, CaO, TiO<sub>2</sub>, P<sub>2</sub>O<sub>5</sub>, V<sub>2</sub>O<sub>5</sub>, ZnO, MnO, Ga<sub>2</sub>O<sub>3</sub>, K2O, CuO, Cr<sub>2</sub>O<sub>3</sub>, and NiO on an un-dried sample basis. The method is applicable to smelting-grade aluminium oxide. The concentration range covered for each of the components is also given.</p>