Informējam, ka Sistēma pielāgota darbam ar interneta pārlūkprogrammu Internet Explorer (8. un jaunākām versijām) un Mozilla Firefox (3.6 un jaunākām versijām).
Izmantojot citu interneta pārlūkprogrammu, brīdinām, ka Sistēmas funkcionalitāte var tikt traucēta.
This document defines testing coupons and methods for the evaluation of the compression strength of AM lattice designs. The standardized test coupons will accommodate the application of a variety of lattice designs, while standardizing the evaluation method.
This document is generally intended to be used in validation or verification activities for an additively manufactured component that incorporates a lattice or porous (non-solid) design.
Details may include limits or requirements for minimum repeated elements and relative dimensions of the specimen.
Note: Due to inherent variability across the manufacturing of AM components, evaluation methods are needed. Specifically, when an eventual component is intended to be subjected to compressive loads, a representative testing coupon is needed to represent the component to undergo destructive evaluation as a surrogate for the component itself.
Reģistrācijas numurs (WIID)
86116
Darbības sfēra
This document defines testing coupons and methods for the evaluation of the compression strength of AM lattice designs. The standardized test coupons will accommodate the application of a variety of lattice designs, while standardizing the evaluation method.
This document is generally intended to be used in validation or verification activities for an additively manufactured component that incorporates a lattice or porous (non-solid) design.
Details may include limits or requirements for minimum repeated elements and relative dimensions of the specimen.
Note: Due to inherent variability across the manufacturing of AM components, evaluation methods are needed. Specifically, when an eventual component is intended to be subjected to compressive loads, a representative testing coupon is needed to represent the component to undergo destructive evaluation as a surrogate for the component itself.