ISO/TC 172/SC 4
| Reģistrācijas numurs (WIID) | Projekta Nr. | Nosaukums | Statuss |
|---|---|---|---|
| 68890 | ISO 14490-7:2016 | Optics and photonics — Test methods for telescopic systems — Part 7: Test methods for limit of resolution | Standarts spēkā |
| 50662 | ISO 14490-8:2011 | Optics and optical instruments — Test methods for telescopic systems — Part 8: Test methods for night-vision devices | Standarts spēkā |
| 74493 | ISO 14490-9:2019 | Optics and photonics — Test methods for telescopic systems — Part 9: Test methods for field curvature | Standarts spēkā |
| 68899 | ISO 20711:2017 | Optics and photonics — Environmental requirements — Test requirements for telescopic systems | Standarts spēkā |
| 42758 | ISO 21094:2008 | Optique et photonique — Systèmes télescopiques — Spécifications pour dispositifs de vision de nuit | Standarts spēkā |
| 17020 | ISO 9336-3:1994 | Optics and optical instruments — Optical transfer function — Application — Part 3: Telescopes | Atcelts |
| 75280 | ISO 9336-3:2020 | Optics and photonics — Optical transfer function — Application — Part 3: Telescopes | Standarts spēkā |
| 78541 | ISO/AWI 14132-5 | Optique et photonique — Vocabulaire relatif aux systèmes télescopiques — Partie 5: Termes pour les dispositifs de vision de nuit | Izstrādē |
| 50743 | ISO/AWI 14490-3 | Optics and optical instruments — Test methods for telescopic systems — Part 3: Test methods for telescopic sights | Izstrādē |
| 78540 | ISO/AWI 14490-8 | Optics and optical instruments — Test methods for telescopic systems — Part 8: Test methods for night-vision devices | Izstrādē |
Attēlo no 41. līdz 50. no pavisam 79 ieraksta(-iem).