ISO/TC 172/SC 4
| Reģistrācijas numurs (WIID) | Projekta Nr. | Nosaukums | Statuss |
|---|---|---|---|
| 66247 | ISO/PWI 14490-3 | Optique et photonique — Méthodes d'essai pour systèmes télescopiques — Partie 3: Méthodes d'essai pour viseurs de tir | Izstrādē |
| 66250 | ISO 14490-6:2014 | Optics and photonics — Test methods for telescopic systems — Part 6: Test methods for veiling glare index | Atcelts |
| 68887 | ISO 14133-1:2016 | Optics and photonics — Specifications for binoculars, monoculars and spotting scopes — Part 1: General purpose instruments | Atcelts |
| 68888 | ISO 14133-2:2016 | Optics and photonics — Specifications for binoculars, monoculars and spotting scopes — Part 2: High performance instruments | Atcelts |
| 68890 | ISO 14490-7:2016 | Optics and photonics — Test methods for telescopic systems — Part 7: Test methods for limit of resolution | Standarts spēkā |
| 68899 | ISO 20711:2017 | Optics and photonics — Environmental requirements — Test requirements for telescopic systems | Standarts spēkā |
| 70461 | ISO 14135-1:2017 | Optique et photonique — Spécifications pour lunettes de pointage — Partie 1: Instruments pour usage général | Atcelts |
| 70462 | ISO 14135-2:2017 | Optics and photonics — Specifications for telescopic sights — Part 2: High-performance instruments | Atcelts |
| 70570 | ISO 14490-5:2017 | Optics and photonics — Test methods for telescopic systems — Part 5: Test methods for transmittance | Atcelts |
| 74493 | ISO 14490-9:2019 | Optics and photonics — Test methods for telescopic systems — Part 9: Test methods for field curvature | Atcelts |
Attēlo no 51. līdz 60. no pavisam 79 ieraksta(-iem).