ISO/TC 172/SC 9
Reģistrācijas numurs (WIID) | Projekta Nr. | Nosaukums | Statuss |
---|---|---|---|
72974 | ISO 14881:2021 | Integrated optics — Interfaces — Parameters relevant to coupling properties | Standarts spēkā |
27396 | ISO 15367-1:2003 | Lasers and laser-related equipment — Test methods for determination of the shape of a laser beam wavefront — Part 1: Terminology and fundamental aspects | Standarts spēkā |
33629 | ISO 15367-2:2005 | Lasers and laser-related equipment — Test methods for determination of the shape of a laser beam wavefront — Part 2: Shack-Hartmann sensors | Standarts spēkā |
28652 | ISO 15902:2004 | Optique et photonique — Optique diffractive — Vocabulaire | Atcelts |
43183 | ISO 15902:2004/Cor 1:2005 | Optique et photonique — Optique diffractive — Vocabulaire — Rectificatif technique 1 | Atcelts |
77771 | ISO 15902:2019 | Optique et photonique — Optique diffractive — Vocabulaire | Standarts spēkā |
35649 | ISO 17526:2003 | Optique et instruments d'optique — Lasers et équipements associés aux lasers — Durée de vie des lasers | Standarts spēkā |
60946 | ISO 17901-1:2015 | Optics and photonics — Holography — Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of holograms | Standarts spēkā |
60947 | ISO 17901-2:2015 | Optics and photonics — Holography — Part 2: Methods for measurement of hologram recording characteristics | Standarts spēkā |
72946 | ISO 17915:2018 | Optique et photonique — Méthode de mesure des lasers semi-conducteurs pour la sensibilité | Standarts spēkā |
Attēlo no 81. līdz 90. no pavisam 146 ieraksta(-iem).