ISO/TC 206
Reģistrācijas numurs (WIID) | Projekta Nr. | Nosaukums | Statuss |
---|---|---|---|
75935 | ISO/NP 23530 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of gallium nitride (GaN) single crystal using high resolution XRD | Izstrādē |
87707 | ISO/NP 24109 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for electrochemical impedance spectroscopy of conductive fine ceramics at elevated temperatures | Izstrādē |
79449 | ISO/NP 24686 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Test Methods for Determination of trace elements in Silicon carbide Fibers Samples using Laser Ablation Inductively Coupled Plasma Mass Spectrometry | Izstrādē |
79452 | ISO/NP 24687 | Titre manque | Izstrādē |
89838 | ISO/NP 25312 | Titre manque | Izstrādē |
89839 | ISO/NP 25313 | Titre manque | Izstrādē |
90505 | ISO/NP 25472 | Titre manque | Izstrādē |
91644 | ISO/NP 25827 | Titre manque | Izstrādē |
44891 | ISO/NP 28704 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for cyclic bending fatigue of porous ceramics at room temperature | Izstrādē |
83345 | ISO/NP 8911 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Laminated-type reference mirrors used for measuring regular spectral reflectance of fine ceramic coatings | Izstrādē |
Attēlo no 241. līdz 250. no pavisam 272 ieraksta(-iem).