ISO/TC 206
Reģistrācijas numurs (WIID) | Projekta Nr. | Nosaukums | Statuss |
---|---|---|---|
83755 | ISO/DIS 10820 | Titre manque | Aptauja |
83694 | ISO 5618-2:2024 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for GaN crystal surface defects — Part 2: Method for determining etch pit density | Standarts spēkā |
83345 | ISO/NP 8911 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Laminated-type reference mirrors used for measuring regular spectral reflectance of fine ceramic coatings | Izstrādē |
83344 | ISO/AWI 8842 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Test methods for evaluating the stability of fine ceramic and fine ceramic/metal multilayer coatings for the exposure to corrosive environments | Izstrādē |
79452 | ISO/NP 24687 | Titre manque | Izstrādē |
79449 | ISO/NP 24686 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Test Methods for Determination of trace elements in Silicon carbide Fibers Samples using Laser Ablation Inductively Coupled Plasma Mass Spectrometry | Izstrādē |
79030 | ISO/NP 19604 | Fine ceramics (advanced ceramics, advanced technical ceramics) Mechanical properties of ceramic composites at high temperature Determination of stress-rupture time diagram under constant tensile loading | Izstrādē |
78779 | ISO 24448:2023 | Standarts spēkā | |
77630 | ISO 24046:2022 | Céramiques techniques (céramique technique, céramique technique avancée) — Méthodes d'essais pour renforts — Détermination des propriétés en traction des fils imprégnés de résine | Standarts spēkā |
77419 | ISO 23946:2020 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Test methods for optical properties of ceramic phosphors for white light-emitting diodes using a gonio-spectrofluorometer | Standarts spēkā |
Attēlo no 71. līdz 80. no pavisam 272 ieraksta(-iem).