ISO/TC 213
| Reģistrācijas numurs (WIID) | Projekta Nr. | Nosaukums | Statuss |
|---|---|---|---|
| 39929 | ISO/WD 4287 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters | Izstrādē |
| 1952 | ISO/WD 1880 | Instruments for the measurement of surface roughness by the profile method — Contact (stylus) instruments of progressive profile transformation — Profile recording instruments | Izstrādē |
| 82741 | ISO/PWI TR 7277 | Mathematics for datums and datum systems | Izstrādē |
| 29650 | ISO/PWI 2768-1 | Spécification géométrique des produits (GPS) — Tolérances générales — Partie 1: Tolérances pour dimensions linéaires et angulaires non affectées de tolérances individuelles | Izstrādē |
| 83816 | ISO/PWI 25178-3 | Spécification géométrique des produits (GPS) — État de surface: Surfacique — Partie 3: Opérateurs de spécification | Izstrādē |
| 66832 | ISO/DIS 5459.2 | Geometrical product specifications (GPS) — Geometrical tolerancing — Datums and datum systems | Izstrādē |
| 30389 | ISO/DTS 16610-29 | Geometrical product specifications (GPS) — Filtration — Part 29: Linear profile filters: Spline wavelets | Izstrādē |
| 50165 | ISO/CD 14660-3 | Geometrical Product Specifications (GPS) — Geometrical features — Part 3: Extracted centre of a sphere | Izstrādē |
| 28078 | ISO/DIS 12780-2.2 | Geometrical Product Specifications (GPS) — Straightness — Part 2: Specification operators | Izstrādē |
| 62307 | ISO 4287:1997/DAmd 2 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters — Amendment 2: Parameters Xsm and Xc | Izstrādē |
Attēlo no 41. līdz 50. no pavisam 484 ieraksta(-iem).