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<p>This document specifies the data acquisition and processing method for three-dimensional electron diffraction using a transmission electron microscope (TEM) to determine the structures of micro/nano crystalline specimens. It provides detailed guidelines on specimen preparation, instrument setup, data acquisition, data processing and results reporting for three-dimensional electron diffraction.</p>
Reģistrācijas numurs (WIID)
91666
Darbības sfēra
<p>This document specifies the data acquisition and processing method for three-dimensional electron diffraction using a transmission electron microscope (TEM) to determine the structures of micro/nano crystalline specimens. It provides detailed guidelines on specimen preparation, instrument setup, data acquisition, data processing and results reporting for three-dimensional electron diffraction.</p>
