ISO/TC 172/SC 1
| Reģistrācijas numurs (WIID) | Projekta Nr. | Nosaukums | Statuss |
|---|---|---|---|
| 37992 | ISO/WD 10110-8 | Optics and photonics — Preparation of drawings for optical elements and systems — Part 8: Surface texture | Izstrādē |
| 91419 | ISO/PWI 10110-1 | Optics and photonics — Preparation of drawings for optical elements and systems — Part 1: General | Izstrādē |
| 32867 | ISO 10110-12:1997/CD Cor 1 | Optique et instruments d'optique — Indications sur les dessins pour éléments et systèmes optiques — Partie 12: Surfaces asphériques — Rectificatif technique 1 | Izstrādē |
| 57571 | ISO/PWI 10110-2 | Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 2: Material imperfections — Stress birefringence | Izstrādē |
| 35993 | ISO/WD 10110-3 | Optique et instruments d'optique — Indications sur les dessins pour éléments et systèmes optiques — Partie 3: Imperfections des matériaux — Bulles et inclusions | Izstrādē |
| 60683 | ISO/PWI 10110-18 | Optics and photonics — Preparation of drawings for optical elements and systems — Part 18: Material imperfections | Izstrādē |
| 93618 | ISO/CD 9022-2 | Optique et photonique — Méthodes d'essais d'environnement — Partie 2: Froid, chaleur et humidité | Izstrādē |
| 28139 | ISO/WD 10109-9 | Optics and optical instruments — Environmental requirements — Part 9: Test requirements for geodetic instruments | Izstrādē |
| 28140 | ISO/WD 10109-3 | Optics and optical instruments — Environmental requirements — Part 3: Test requirements for photographic instruments | Izstrādē |
| 26177 | ISO/DTR 14999-1 | Optics and optical instruments — Interferometric measurement of optical elements and optical systems — Part 1: Definitions and fundamental relationships | Izstrādē |
Attēlo no 21. līdz 30. no pavisam 210 ieraksta(-iem).