ISO/TC 172/SC 9
| Reģistrācijas numurs (WIID) | Projekta Nr. | Nosaukums | Statuss |
|---|---|---|---|
| 33111 | ISO/CD 17527 | Optics and optical instruments — Diffractive optics — Fundamental terminology, symbols and units of measurement associated with spectroscopic applications | Izstrādē |
| 54282 | ISO/NP 13682-2 | Lasers and laser-related equipment - Determination of the properties of ultrashort laser pulses - Part2: Autocorrelation measurement method — Part 2: | Izstrādē |
| 33630 | ISO/WD 15367-3 | Lasers and laser related equipment — Test methods for determination of the shape of a laser beam wavefront — Part 3: Interferometric measurements | Izstrādē |
| 40767 | ISO 11554:2003/NP Amd 1 | Optique et instruments d'optique — Lasers et équipements associés aux lasers — Méthodes d'essai de la puissance et de l'énergie des faisceaux lasers et de leurs caractéristiques temporelles — Amendement 1 | Izstrādē |
| 50333 | ISO/NP 11146-2 | Lasers and laser-related equipment — Test methods for laser beam widths, divergence angles and beam propagation ratios — Part 2: General astigmatic beams | Izstrādē |
| 52959 | ISO/NP 15367-1 | Lasers and laser-related equipment — Test methods for determination of the shape of a laser beam wavefront — Part 1: Terminology and fundamental aspects | Izstrādē |
| 52957 | ISO/NP 11670 | Lasers and laser-related equipment — Test methods for laser beam parameters — Beam positional stability | Izstrādē |
| 77721 | ISO/PWI 21254-1 | Lasers et équipements associés aux lasers — Méthodes d'essai du seuil d'endommagement provoqué par laser — Partie 1: Définitions et principes de base | Izstrādē |
| 70724 | ISO/WD 21254-2 | Lasers et équipements associés aux lasers — Méthodes d'essai du seuil d'endommagement provoqué par laser — Partie 2: Détermination du seuil | Izstrādē |
| 40765 | ISO 11145:2001/DAmd 1 | Optics and optical instruments — Lasers and laser-related equipment — Vocabulary and symbols — Amendment 1 | Izstrādē |
Attēlo no 111. līdz 120. no pavisam 146 ieraksta(-iem).