ISO/TC 202/SC 3

Reģistrācijas numurs (WIID)Projekta Nr.NosaukumsStatuss
70360ISO 29301:2017Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structuresAtcelts
75516ISO 23420:2021Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysisStandarts spēkā
79091ISO 24639:2022Analyse par microfaisceaux — Microscope électronique analytique — Procédure d'étalonnage de l'échelle d'énergie pour l'analyse élémentaire par spectroscopie de perte d'énergie des électronsStandarts spēkā
84289ISO/CD 13139Microbeam analysis — Analytical electron microscopy — The measurement of the dislocation density in thin metalsIzstrādē
84838ISO/FDIS 16887Microbeam analysis — Analytical electron microscopy — Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam systemIzstrādē
86203ISO 19214:2024Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopyStandarts spēkā
86942ISO 29301:2023Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structuresStandarts spēkā
87682ISO 20263:2024Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materialsStandarts spēkā
87733ISO 25498:2025Analyse par microfaisceaux — Microscopie électronique analytique — Analyse par diffraction par sélection d'aire au moyen d'un microscope électronique en transmissionStandarts spēkā
90097ISO/NP 25386.2Microbeam Analysis-Analytical Electron Microscopy-Vocabulary used in TEM grids and supporting filmsIzstrādē
Attēlo no 11. līdz 20. no pavisam 26 ieraksta(-iem).