ISO/TC 202/SC 3
| Reģistrācijas numurs (WIID) | Projekta Nr. | Nosaukums | Statuss |
|---|---|---|---|
| 91808 | ISO/AWI 25871 | Microbeam analysis --Analytical electron microscopy — Method of thickness measurement for thin crystals by convergent beam electron diffraction | Izstrādē |
| 90100 | ISO/FDIS 25387 | Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope | Izstrādē |
| 91667 | ISO/PWI 25836 | Titre manque | Izstrādē |
| 60576 | ISO/WD 17802 | Microbeam analysis — Analytical transmission electron microscopy — Methods of the energy calibration for electron energy loss spectroscopy | Izstrādē |
| 42952 | ISO/NP 25499 | Guidelines for the energy calibration and energy resolution determination methods for electron energy loss spectroscopy | Izstrādē |
Attēlo no 21. līdz 25. no pavisam 25 ieraksta(-iem).