ISO/TC 202/SC 3
| Reģistrācijas numurs (WIID) | Projekta Nr. | Nosaukums | Statuss |
|---|---|---|---|
| 45355 | ISO/WD 29222 | Titre manque | Izstrādē |
| 60576 | ISO/WD 17802 | Microbeam analysis — Analytical transmission electron microscopy — Methods of the energy calibration for electron energy loss spectroscopy | Izstrādē |
| 91667 | ISO/PWI 25836 | Titre manque | Izstrādē |
| 90097 | ISO/PWI 25386 | Microbeam Analysis-Analytical Electron Microscopy-The main performance parameters and design specifications of the TEM standard grid | Izstrādē |
| 91666 | ISO/NP 25835 | Titre manque | Izstrādē |
| 42952 | ISO/NP 25499 | Guidelines for the energy calibration and energy resolution determination methods for electron energy loss spectroscopy | Izstrādē |
| 42950 | ISO/NP 25497 | Guidelines for the determination of experimental parameters for electron energy loss spectroscopy | Izstrādē |
| 84838 | ISO/FDIS 16887 | Microbeam analysis — Analytical electron microscopy — Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam system | Izstrādē |
| 92612 | ISO/CD 26100 | Titre manque | Izstrādē |
| 91808 | ISO/CD 25871 | Microbeam analysis --Analytical electron microscopy — Method of thickness measurement for thin crystals by convergent beam electron diffraction | Izstrādē |
Attēlo no 1. līdz 10. no pavisam 25 ieraksta(-iem).