ISO/TC 202/SC 3
| Reģistrācijas numurs (WIID) | Projekta Nr. | Nosaukums | Statuss |
|---|---|---|---|
| 92612 | ISO/AWI 26100 | Titre manque | Izstrādē |
| 91808 | ISO/AWI 25871 | Microbeam analysis --Analytical electron microscopy — Method of thickness measurement for thin crystals by convergent beam electron diffraction | Izstrādē |
| 91667 | ISO/PWI 25836 | Titre manque | Izstrādē |
| 91666 | ISO/PWI 25835 | Titre manque | Izstrādē |
| 90100 | ISO/FDIS 25387 | Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope | Izstrādē |
| 90097 | ISO/PWI 25386 | Microbeam Analysis-Analytical Electron Microscopy-The main performance parameters and design specifications of the TEM standard grid | Izstrādē |
| 87733 | ISO 25498:2025 | Analyse par microfaisceaux — Microscopie électronique analytique — Analyse par diffraction par sélection d'aire au moyen d'un microscope électronique en transmission | Standarts spēkā |
| 87682 | ISO 20263:2024 | Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials | Standarts spēkā |
| 86942 | ISO 29301:2023 | Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures | Standarts spēkā |
| 86203 | ISO 19214:2024 | Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy | Standarts spēkā |
Attēlo no 1. līdz 10. no pavisam 25 ieraksta(-iem).