71.040.40 Ķīmiskās analīzes

Attēlo no 205. līdz 216. no pavisam 251 ieraksta(-iem).

ISO/TS 22933:2022

tehniskā specifikācija (TS)

EN
Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
Skatīt

103.80 €

ISO 23124:2024

standarts

EN
Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope
Skatīt

68.85 €

ISO 23170:2022

standarts

EN
Surface chemical analysis — Depth profiling — Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
Skatīt

68.85 €

ISO 23729:2022

standarts

EN
Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Skatīt

68.85 €

ISO 23812:2009

standarts

EN
Surface chemical analysis Secondary-ion mass spectrometry Method for depth calibration for silicon using multiple delta-layer reference materials
Skatīt

139.82 €

ISO 23830:2008

standarts

EN
Surface chemical analysis Secondary-ion mass spectrometry Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
Skatīt

68.85 €

ISO 24236:2005

standarts

EN
Surface chemical analysis Auger electron spectroscopy Repeatability and constancy of intensity scale
Skatīt

103.80 €

ISO 24237:2005

standarts

EN
Surface chemical analysis X-ray photoelectron spectroscopy Repeatability and constancy of intensity scale
Skatīt

68.85 €

ISO 24417:2022

standarts

EN
Surface chemical analysis — Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
Skatīt

68.85 €

ISO 24465:2023

standarts

EN
Surface chemical analysis — Determination of the minimum detectability of surface plasmon resonance device
Skatīt

68.85 €

ISO/TS 25138:2010

tehniskā specifikācija (TS)

EN
Surface chemical analysis Analysis of metal oxide films by glow-discharge optical-emission spectrometry
Skatīt

68.85 €

ISO/TS 25138:2019

tehniskā specifikācija (TS)

EN
Surface chemical analysis Analysis of metal oxide films by glow-discharge optical-emission spectrometry
Skatīt

68.85 €