71.040.40 Ķīmiskās analīzes
Attēlo no 205. līdz 216. no pavisam 252 ieraksta(-iem).
ISO 22581:2021
standarts
EN
Surface chemical analysis -- Near real-time information from the X-ray photoelectron spectroscopy survey scan -- Rules for identification of, and correction for, surface contamination by carbon-containing compounds
105.92 €
ISO/TS 22933:2022
tehniskā specifikācija (TS)
EN
Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
105.92 €
ISO 23124:2024
standarts
EN
Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope
70.97 €
ISO 23170:2022
standarts
EN
Surface chemical analysis — Depth profiling — Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
168.41 €
ISO 23729:2022
standarts
EN
Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
105.92 €
ISO 23812:2009
standarts
EN
Surface chemical analysis Secondary-ion mass spectrometry Method for depth calibration for silicon using multiple delta-layer reference materials
142.99 €
ISO 23830:2008
standarts
EN
Surface chemical analysis Secondary-ion mass spectrometry Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
70.97 €
ISO 24236:2005
standarts
EN
Surface chemical analysis Auger electron spectroscopy Repeatability and constancy of intensity scale
105.92 €
ISO 24237:2005
standarts
EN
Surface chemical analysis X-ray photoelectron spectroscopy Repeatability and constancy of intensity scale
70.97 €
ISO 24417:2022
standarts
EN
Surface chemical analysis — Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
168.41 €
ISO 24465:2023
standarts
EN
Surface chemical analysis — Determination of the minimum detectability of surface plasmon resonance device
70.97 €
ISO/TS 25138:2010
tehniskā specifikācija (TS)
EN
Surface chemical analysis Analysis of metal oxide films by glow-discharge optical-emission spectrometry
70.97 €