71.040.40 Ķīmiskās analīzes
Attēlo no 205. līdz 216. no pavisam 247 ieraksta(-iem).
ISO 23812:2009
standarts
EN
Surface chemical analysis Secondary-ion mass spectrometry Method for depth calibration for silicon using multiple delta-layer reference materials
97.87 €
ISO 23830:2008
standarts
EN
Surface chemical analysis Secondary-ion mass spectrometry Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
48.19 €
ISO 24236:2005
standarts
EN
Surface chemical analysis Auger electron spectroscopy Repeatability and constancy of intensity scale
72.66 €
ISO 24237:2005
standarts
EN
Surface chemical analysis X-ray photoelectron spectroscopy Repeatability and constancy of intensity scale
48.19 €
ISO 24417:2022
standarts
EN
Surface chemical analysis — Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
114.92 €
ISO 24465:2023
standarts
EN
Surface chemical analysis — Determination of the minimum detectability of surface plasmon resonance device
48.19 €
ISO/TS 25138:2010
tehniskā specifikācija (TS)
EN
Surface chemical analysis Analysis of metal oxide films by glow-discharge optical-emission spectrometry
48.19 €
ISO/TS 25138:2019
tehniskā specifikācija (TS)
EN
Surface chemical analysis Analysis of metal oxide films by glow-discharge optical-emission spectrometry
48.19 €
ISO/TS 25138:2025
tehniskā specifikācija (TS)
EN
Surface chemical analysis — Analysis of metal oxide films by glow discharge optical emission spectrometry
131.24 €
ISO 27911:2011
standarts
EN
Surface chemical analysis Scanning-probe microscopy Definition and calibration of the lateral resolution of a near-field optical microscope
72.66 €
ISO 28600:2011
standarts
EN
Surface chemical analysis Data transfer format for scanning-probe microscopy
114.92 €
ISO/TS 29041:2008
tehniskā specifikācija (TS)
EN
Gas mixtures Gravimetric preparation Mastering correlations in composition
72.66 €