71.040.40 Ķīmiskās analīzes

Attēlo no 181. līdz 192. no pavisam 251 ieraksta(-iem).

ISO/TR 19693:2018

tehniskais ziņojums (TR)

EN
Surface chemical analysis Characterization of functional glass substrates for biosensing applications
Skatīt

164.18 €

ISO 19830:2015

standarts

EN
Surface chemical analysis Electron spectroscopies Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Skatīt

139.82 €

ISO 20289:2018

standarts

EN
Surface chemical analysis Total reflection X-ray fluorescence analysis of water
Skatīt

68.85 €

ISO 20289:2025

standarts

EN
Surface chemical analysis — Total reflection X-ray fluorescence analysis of water
Skatīt

68.85 €

ISO 20341:2003

standarts

EN
Surface chemical analysis Secondary-ion mass spectrometry Method for estimating depth resolution parameters with multiple delta-layer reference materials
Skatīt

45.55 €

ISO 20411:2018

standarts

EN
Surface chemical analysis Secondary ion mass spectrometry Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
Skatīt

103.80 €

ISO 20579-1:2024

standarts

EN
Surface chemical analysis — Sample handling, preparation and mounting — Part 1: Documenting and reporting the handling of specimens prior to analysis
Skatīt

68.85 €

ISO 20579-2:2025

standarts

EN
Surface chemical analysis — Sample handling, preparation and mounting — Part 2: Documenting and reporting the preparation and mounting of specimens for analysis
Skatīt

68.85 €

ISO 20579-3:2021

standarts

EN
Surface chemical analysis -- Sample handling, preparation and mounting
Skatīt

68.85 €

ISO 20579-4:2018

standarts

EN
Surface chemical analysis Guidelines to sample handling, preparation and mounting
Skatīt

139.82 €

ISO 20903:2011

standarts

EN
Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Methods used to determine peak intensities and information required when reporting results
Skatīt

68.85 €

ISO 20903:2019

standarts

EN
Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Methods used to determine peak intensities and information required when reporting results
Skatīt

103.80 €