71.040.40 Ķīmiskās analīzes
Attēlo no 145. līdz 156. no pavisam 243 ieraksta(-iem).
ISO 17973:2002
standarts
EN
Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
48.19 €
ISO 17973:2016
standarts
EN
Surface chemical analysis Medium-resolution Auger electron spectrometers Calibration of energy scales for elemental analysis
48.19 €
ISO 17973:2024
standarts
EN
Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
48.19 €
ISO 17974:2002
standarts
EN
Surface chemical analysis — High-resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical-state analysis
114.92 €
ISO 18114:2003
standarts
EN
Surface chemical analysis Secondary-ion mass spectrometry Determination of relative sensitivity factors from ion-implanted reference materials
48.19 €
ISO 18114:2021
standarts
EN
Surface chemical analysis — Secondary-ion mass spectrometry — Determination of relative sensitivity factors from ion-implanted reference materials
31.88 €
ISO 18115-1:2023
standarts
EN
Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
31.88 €
ISO 18115-2:2021
standarts
EN
Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
31.88 €
ISO 18115-3:2022
standarts
EN
Surface chemical analysis — Vocabulary — Part 3: Terms used in optical interface analysis
31.88 €
ISO 18116:2005
standarts
EN
Surface chemical analysis Guidelines for preparation and mounting of specimens for analysis
48.19 €
ISO 18117:2009
standarts
EN
Surface chemical analysis Handling of specimens prior to analysis
48.19 €
ISO 18118:2004
standarts
EN
Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
48.19 €