71.040.40 Ķīmiskās analīzes
Attēlo no 157. līdz 168. no pavisam 252 ieraksta(-iem).
ISO 18114:2003
standarts
EN
Surface chemical analysis Secondary-ion mass spectrometry Determination of relative sensitivity factors from ion-implanted reference materials
70.97 €
ISO 18114:2021
standarts
EN
Surface chemical analysis — Secondary-ion mass spectrometry — Determination of relative sensitivity factors from ion-implanted reference materials
46.61 €
ISO 18115-1:2023
standarts
EN
Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
46.61 €
ISO 18115-2:2021
standarts
EN
Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
46.61 €
ISO 18115-3:2022
standarts
EN
Surface chemical analysis — Vocabulary — Part 3: Terms used in optical interface analysis
46.61 €
ISO 18116:2005
standarts
EN
Surface chemical analysis Guidelines for preparation and mounting of specimens for analysis
70.97 €
ISO 18117:2009
standarts
EN
Surface chemical analysis Handling of specimens prior to analysis
70.97 €
ISO 18118:2004
standarts
EN
Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
70.97 €
ISO 18118:2015
standarts
EN
Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
70.97 €
ISO 18118:2024
standarts
EN
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
142.99 €
ISO 18337:2015
standarts
EN
Surface chemical analysis Surface characterization Measurement of the lateral resolution of a confocal fluorescence microscope
70.97 €
ISO/TR 18392:2005
tehniskais ziņojums (TR)
EN
Surface chemical analysis X-ray photoelectron spectroscopy Procedures for determining backgrounds
70.97 €