71.040.40 Ķīmiskās analīzes
Attēlo no 157. līdz 168. no pavisam 248 ieraksta(-iem).
ISO 18115-3:2022
standarts
EN
Surface chemical analysis — Vocabulary — Part 3: Terms used in optical interface analysis
45.55 €
ISO 18116:2005
standarts
EN
Surface chemical analysis Guidelines for preparation and mounting of specimens for analysis
68.85 €
ISO 18117:2009
standarts
EN
Surface chemical analysis Handling of specimens prior to analysis
68.85 €
ISO 18118:2004
standarts
EN
Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
68.85 €
ISO 18118:2015
standarts
EN
Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
68.85 €
ISO 18118:2024
standarts
EN
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
139.82 €
ISO 18337:2015
standarts
EN
Surface chemical analysis Surface characterization Measurement of the lateral resolution of a confocal fluorescence microscope
68.85 €
ISO/TR 18392:2005
tehniskais ziņojums (TR)
EN
Surface chemical analysis X-ray photoelectron spectroscopy Procedures for determining backgrounds
68.85 €
ISO/TR 18394:2006
tehniskais ziņojums (TR)
EN
Surface chemical analysis Auger electron spectroscopy Derivation of chemical information
68.85 €
ISO/TR 18394:2016
tehniskais ziņojums (TR)
EN
Surface chemical analysis Auger electron spectroscopy Derivation of chemical information
139.82 €
ISO/TS 18507:2015
tehniskā specifikācija (TS)
EN
Surface chemical analysis Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
164.18 €
ISO 18516:2006
standarts
EN
Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Determination of lateral resolution
68.85 €