71.040.40 Ķīmiskās analīzes

Alumīnija oksīdu, cirkonija oksīdu un silīcija dioksīdu saturošo ugunsizturīgo materiālu ķīmiskā analīze. Ugunsizturīgie materiāli ar ZrO2 saturu 5 % līdz 45 % (metode, kurā neizmanto rentgenfluorescenci). 2. daļa: Mitrā ķīmiskā analīze

Alumīnija oksīdu, cirkonija oksīdu un silīcija dioksīdu saturošo ugunsizturīgo materiālu ķīmiskā analīze. Ugunsizturīgie materiāli ar ZrO22 saturu 5 % līdz 45 % (metode, kurā neizmanto rentgenfluorescenci). 3. daļa: Liesmas atomabsorbcijas spektrofotometrija (FAAS) un induktīvi saistītas plazmas emisijas spektrometrija (ICP-AES)

Surface chemical analysis -- Scanning probe microscopy -- Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

Surface chemical analysis X-ray photoelectron and Auger electron spectrometers Linearity of intensity scale

Surface chemical analysis Information format for static secondary-ion mass spectrometry

Surface chemical analysis Depth profiling Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer

Surface chemical analysis Secondary ion mass spectrometry Method for determining yield volume in argon cluster sputter depth profiling of organic materials

Surface chemical analysis -- Near real-time information from the X-ray photoelectron spectroscopy survey scan -- Rules for identification of, and correction for, surface contamination by carbon-containing compounds

Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS

Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope

Surface chemical analysis — Depth profiling — Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering

Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size