71.040.40 Ķīmiskās analīzes
Attēlo no 73. līdz 84. no pavisam 243 ieraksta(-iem).
ISO 12963:2017
standarts
EN
Gas analysis Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
97.87 €
ISO 12963:2017/Amd 1:2020
grozījums
EN
Correction to Formula 5
13.35 €
ISO 13083:2015
standarts
EN
Surface chemical analysis Scanning probe microscopy Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
72.66 €
ISO 13084:2011
standarts
EN
Surface chemical analysis Secondary-ion mass spectrometry Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
48.19 €
ISO 13084:2018
standarts
EN
Surface chemical analysis Secondary ion mass spectrometry Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
72.66 €
ISO 13095:2014
standarts
EN
Surface Chemical Analysis Atomic force microscopy Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
97.87 €
ISO 13424:2013
standarts
EN
Surface chemical analysis X-ray photoelectron spectroscopy Reporting of results of thin-film analysis
131.24 €
ISO 14167:2018
standarts
EN
Gas analysis General quality aspects and metrological traceability of calibration gas mixtures
97.87 €
ISO/TS 14167:2003
tehniskā specifikācija (TS)
EN
Gas analysis General quality assurance aspects in the use of calibration gas mixtures - Guidelines
48.19 €
ISO/TR 14187:2011
tehniskais ziņojums (TR)
EN
Surface chemical analysis Characterization of nanostructured materials
48.19 €
ISO/TR 14187:2020
tehniskais ziņojums (TR)
EN
Surface chemical analysis -- Characterization of nanostructured materials
131.24 €
ISO 14237:2010
standarts
EN
Surface chemical analysis Secondary-ion mass spectrometry Determination of boron atomic concentration in silicon using uniformly doped materials
97.87 €