71.040.40 Ķīmiskās analīzes
Attēlo no 73. līdz 84. no pavisam 250 ieraksta(-iem).
ISO 12406:2010
standarts
EN
Surface chemical analysis Secondary-ion mass spectrometry Method for depth profiling of arsenic in silicon
103.80 €
LVS EN 12698-1:2007
standarts
EN
Nitrīdsaistīta karborunda ugunsizturīgo izstrādājumu ķīmiskā analīze. 1. daļa: Ķīmiskās metodes
20.34 €
LVS EN 12698-2:2007
standarts
EN
Nitrīdsaistīta karborunda ugunsizturīgo izstrādājumu ķīmiskā analīze. 2. daļa: Rentgenstarojuma difrakcijas (XRD) metodes
12.14 €
ISO 12963:2017
standarts
EN
Gas analysis Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
139.82 €
ISO 12963:2017/Amd 1:2020
grozījums
EN
Correction to Formula 5
19.07 €
ISO 13083:2015
standarts
EN
Surface chemical analysis Scanning probe microscopy Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
103.80 €
ISO 13084:2011
standarts
EN
Surface chemical analysis Secondary-ion mass spectrometry Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
68.85 €
ISO 13084:2018
standarts
EN
Surface chemical analysis Secondary ion mass spectrometry Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
68.85 €
ISO 13084:2025
standarts
EN
Surface chemical analysis — Mass spectrometries — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
68.85 €
ISO 13095:2014
standarts
EN
Surface Chemical Analysis Atomic force microscopy Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
139.82 €
ISO 13424:2013
standarts
EN
Surface chemical analysis X-ray photoelectron spectroscopy Reporting of results of thin-film analysis
187.48 €
ISO 14167:2018
standarts
EN
Gas analysis General quality aspects and metrological traceability of calibration gas mixtures
139.82 €