71.040.40 Ķīmiskās analīzes
Attēlo no 85. līdz 96. no pavisam 243 ieraksta(-iem).
ISO 14606:2000
standarts
EN
Surface chemical analysis Sputter depth profiling Optimization using layered systems as reference materials
48.19 €
ISO 14606:2015
standarts
EN
Surface chemical analysis Sputter depth profiling Optimization using layered systems as reference materials
48.19 €
ISO 14606:2022
standarts
EN
Surface chemical analysis — Sputter depth profiling — Optimization using layered systems as reference materials
72.66 €
ISO 14701:2011
standarts
EN
Surface chemical analysis X-ray photoelectron spectroscopy Measurement of silicon oxide thickness
48.19 €
ISO 14701:2018
standarts
EN
Surface chemical analysis X-ray photoelectron spectroscopy Measurement of silicon oxide thickness
72.66 €
ISO 14706:2000
standarts
EN
Surface chemical analysis Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
48.19 €
ISO 14706:2014
standarts
EN
Surface chemical analysis Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
97.87 €
ISO 14707:2000
standarts
EN
Surface chemical analysis Glow discharge optical emission spectrometry (GD-OES) Introduction to use
48.19 €
ISO 14707:2015
standarts
EN
Surface chemical analysis Glow discharge optical emission spectrometry (GD-OES) Introduction to use
48.19 €
ISO 14707:2021
standarts
EN
Surface chemical analysis -- Glow discharge optical emission spectrometry (GD-OES) -- Introduction to use
48.19 €
ISO 14912:2003
standarts
EN
Gas analysis Conversion of gas mixture composition data
147.55 €
ISO 14912:2003/Cor 1:2006
koriģējums
EN
0.00 €